Pressure and Temperature Dependences of the Electronic Structure of CeIrSi Probed by Resonant X-ray Emission Spectroscopy
スポンサーリンク
概要
著者
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YAMAOKA Hitoshi
Harima Institute, RIKEN (The Institute of Physical and Chemical Research)
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SETTAI Rikio
Faculty of Science, Osaka University
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ONUKI Yoshichika
Faculty of Science, Osaka University
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Tsujii Naohito
Quantum Beam Center National Institute For Materials Science
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Kotani Akio
Harima Institute, RIKEN (The Institute of Physical and Chemical Research), Sayo, Hyogo 679-5148, Japan
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Jarrige Ignace
Japan Atomic Energy Agency, Sayo, Hyogo 679-5148, Japan
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Ishii Hirofumi
National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan, R.O.C.
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Tsuei Ku-Ding
National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan, R.O.C.
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Hiraoka Nozumu
National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan, R.O.C.
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Lin Jung-Fu
Department of Geological Sciences, The University of Texas at Austin, Austin, TX 78712, U.S.A.
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Honda Fuminori
Faculty of Science, Osaka University, Toyonaka, Osaka 569-0043, Japan
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