Optical Properties of Evolutionary Grown Layers of Carbon Nanowalls Analyzed by Spectroscopic Ellipsometry

概要

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Carbon nanowalls (CNWs), vertically standing graphene sheets, grown by the radical injection plasma-enhanced chemical vapor deposition system were analyzed by spectroscopic ellipsometry. The refractive indexes ($n$), extinction coefficients ($k$), and optical band gaps ($E_{\text{g}}$) of evolutionary growth layers were evaluated using the Tauc–Lorentz model with the effective medium approximation. It was observed that an amorphous carbon interfacial layer with $n$ of 1.9–2.0 was formed prior to the growth of CNWs with $n$ of 1.2–1.5. Moreover, the imaginary parts of complex dielectric functions analyzed using the Tauc–Lorentz model indicate the possibility that the CNWs have semiconducting features.
2010-06-25