Influence of Anions on Electrochemical Redox Reactions and Electrical Properties using a Viologen Derivative
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概要
- 論文の詳細を見る
Self-assembled monolayers of alkane derivatives with sulfur-containing head groups on gold substrates have been widely examined recently, since the binding between S atoms and the Au surface is strong. Viologen derivatives have been extensively investigated because of their well-known electrochemical behavior, including behavior as the electron acceptors for the electric charge delivery mediation of devices. Self-assembled viologen monolayers were prepared on the gold surface of a quartz crystal microbalance (QCM) that has been used as a nanogram order mass detector. The self-assembly of viologen derivatives has been determined by the resonant frequency shift of a QCM using a quartz crystal analyzer (QCA). Well-defined peaks were observed at nearly equal charges during the redox reaction in cyclic voltammetry (CV). The electrochemical behavior of self-assembled viologen monolayers has been measured by the electrochemical QCM (EQCM) method. We also used scanning tunneling microscopy (STM) to manipulate the surface on a nanometer scale to form nano-structures and measured current–voltage ($I$–$V$) characteristics using scanning tunneling spectroscopy (STS).
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-04-30
著者
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KWON Young-Soo
Department of Electrical Engineering & NTRC, Dong-A University
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KAFI A.
Department of Electrical Engineering & CIIPMS, Dong-A University
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Qian Dong-jin
Institute Of Advanced Materials Fudan University
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Park Sang-hyun
Department Of Computer Science And Engineering Korea University
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Lee Dong-yun
Department Of Electrical Engineering & Ciipms Dong-a University
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Qian Dong-Jin
Institute of Advanced Materials, Fudan University, 220, Handan road, Shanghai 200433, China
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Park Sang-Hyun
Department of Electrical Engineering and CIIPMS, Dong-A University, 840, Hadan-2dong, Saha-gu, Busan 604-714, Korea
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Kafi A.
Department of Electrical Engineering and CIIPMS, Dong-A University, 840, Hadan-2dong, Saha-gu, Busan 604-714, Korea
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Kwon Young-Soo
Department of Electrical Engineering and CIIPMS, Dong-A University, 840, Hadan-2dong, Saha-gu, Busan 604-714, Korea
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Lee Dong-Yun
Department of Electrical Engineering and CIIPMS, Dong-A University, 840, Hadan-2dong, Saha-gu, Busan 604-714, Korea
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