The Measurement of Electrical Conduction of Self-Assembled Viologen Derivatives Using Scanning Tunneling Microscopy
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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KWON Young-Soo
Department of Electrical Engineering & NTRC, Dong-A University
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QIAN Dong-Jin
Institute of Advanced Materials, Fudan University
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Qian Dong-jin
Institute Of Advanced Materials Fudan University
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Kwon Young-soo
Department Of Electrical Engineering & Ciipms Dong-a University
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LEE Nam-Suk
Department of Electrical Engineering & CIIPMS, Dong-A University
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SHIN Hoon-Kyu
NCNT, Pohang University of Science and Technology
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Lee Nam-suk
Department Of Electrical Engineering & Ciipms Dong-a University
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Shin Hoon-kyu
Ncnt Pohang University Of Science And Technology
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