Laser-Induced Crystallization in AgInSbTe Phase-Change Optical Disk
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概要
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Laser-induced crystallization in the initialization and erasing processes of a AgInSbTe phase-change optical recording disk was studied. After laser initialization, a AgInSbTe film formed a metastable face-centered cubic (f.c.c.) phase. Both the high-resolution transmission electron microscopy (HRTEM) cross-sectional image and the static test results showed the difficulty of nucleation. At low linear velocities, i.e., CD 1X and CD 2X, several clusters formed in amorphous marks due to the low cooling rate and the longer reheating of the subsequently applied pulses. These clusters enhanced nucleation and the amorphous marks probably crystallized via the nucleation and grain growth mechanism in the erasing process. The degree of order in the amorphous marks decreased with linear velocity, and no clusters existed in the amorphous marks at CD 4X. Due to the difficulty of nucleation, the erasing process was predominated by the direct grain growth mechanism at high linear velocities.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-05-15
著者
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Chou Lih-hsin
Department Of Materials Science And Engineering Narional Tsing Hua University
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Chang Yem-yeu
Department Of Materials Science And Engineering Narional Tsing Hua University
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Chou Lih-Hsin
Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan 300, Republic of China
関連論文
- Simulation Study of Phase-Change Optical Recording Disks
- Jitter Raising Mechanisms for Compact Disk(CD)-Rewritable at Quadruple CD Velocity
- Thermally Activated Conductivity of Hydrogenated Amorphous Carbon Films Induced by Argon Plasma Bombardment
- Phases of the Initialized AgInSbTe Phase Change Optical Recording Films : Optics and Quantum Electronics
- Erasing Mechanisms of Ag-In-Sb-Te Compact Disk(CD)-Rewritable
- Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk
- Laser-Induced Crystallization in AgInSbTe Phase-Change Optical Disk
- Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk