Jitter Raising Mechanisms for Compact Disk(CD)-Rewritable at Quadruple CD Velocity

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概要

• 論文の詳細を見る

• A disk designed for compact disk(CD)2X is employed to test its performance at CD 4X. The erasability at CD 4X is poorer than that at CD 2X. A sharp increase in jitter after overwriting for CD 4X was observed as a result of the existence of two different amorphous mark shapes. One of them is of normal shape and the other is extended with a tail in the trailing part. For overwriting more than 50 times, only one type of amorphous mark with tiny sharp tail was observed. This singular amorphous mark shape gives rise to a decrease in jitter. For much higher overwriting cycles, the jitter will increase with the amount of pinholes present.

• 社団法人応用物理学会の論文
• 2000-12-01

著者

• Chang Y‐y

  Department Of Materials Science And Engineering National Tsing Hua University

• Chou Lih-hsin

  Department Of Materials Science And Engineering Narional Tsing Hua University

• CHANG Yem-Yeu

  Department of Materials Science and Engineering, National Tsing Hua University

• Chang Yem-yeu

  Department Of Materials Science And Engineering Narional Tsing Hua University

関連論文

• Kinetic Crystallization Behavior of Phase-Change Medium
• Simulation Study of Phase-Change Optical Recording Disks
• Jitter Raising Mechanisms for Compact Disk(CD)-Rewritable at Quadruple CD Velocity
• Thermally Activated Conductivity of Hydrogenated Amorphous Carbon Films Induced by Argon Plasma Bombardment
• Phases of the Initialized AgInSbTe Phase Change Optical Recording Films : Optics and Quantum Electronics
• Erasing Mechanisms of Ag-In-Sb-Te Compact Disk(CD)-Rewritable
• Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk
• Laser-Induced Crystallization in AgInSbTe Phase-Change Optical Disk
• Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk

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