Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk

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概要

• 論文の詳細を見る

• The microstructures of AgInSbTe recording marks at different compact disk (CD) linear velocities are examined by high-resolution transmission electron microscopy (HRTEM). The recording marks are amorphous with some short-range order (clusters), and the degree of order in the recording marks decreases with linear velocities. The clusters in amorphous marks can enhance nucleation, so the amorphous marks can crystallize via nucleation and growth mechanism in the erasing process at low linear velocities. No clusters exist in the amorphous marks at CD 4X. Due to the difficulty of nucleation, the erasing process is dominated by the direct grain growth mechanism at high linear velocities.

• INSTITUTE OF PURE AND APPLIED PHYSICSの論文
• 2003-01-15

著者

• Chou Lih-hsin

  Department Of Materials Science And Engineering Narional Tsing Hua University

• Chang Yem-yeu

  Department Of Materials Science And Engineering Narional Tsing Hua University

関連論文

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• Phases of the Initialized AgInSbTe Phase Change Optical Recording Films : Optics and Quantum Electronics
• Erasing Mechanisms of Ag-In-Sb-Te Compact Disk(CD)-Rewritable
• Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk
• Laser-Induced Crystallization in AgInSbTe Phase-Change Optical Disk
• Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk

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