Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2003-01-15
著者
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CHOU Lih-Hsin
Department of Materials Science and Engineering, National Tsing Hua University
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Chou Lih-hsin
Department Of Materials Science And Engineering National Tsing Hua University
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Chou Lih-hsin
Department Of Materials Science And Engineering Narional Tsing Hua University
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Chang Yem-yeu
Department Of Materials Science And Engineering Narional Tsing Hua University
関連論文
- Simulation Study of Phase-Change Optical Recording Disks
- Jitter Raising Mechanisms for Compact Disk(CD)-Rewritable at Quadruple CD Velocity
- Thermally Activated Conductivity of Hydrogenated Amorphous Carbon Films Induced by Argon Plasma Bombardment
- Phases of the Initialized AgInSbTe Phase Change Optical Recording Films : Optics and Quantum Electronics
- Erasing Mechanisms of Ag-In-Sb-Te Compact Disk(CD)-Rewritable
- Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk
- Laser-Induced Crystallization in AgInSbTe Phase-Change Optical Disk
- Microstructural Effects of Recording Marks on Erasing in AgInSbTe Phase-Change Optical Disk