Conductivity Measurements of Stilbene-Based Molecules Incorporated into Self-Assembled Monolayers by Conducting Probe Atomic Force Microscopy
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概要
- 論文の詳細を見る
We describe a technique for acquiring current-voltage ($I$–$V$) characteristics of a metal-molecule-metal junction using a conducting probe atomic force microscopy (CP-AFM) technique. To conduct a repetitive experiment efficiently, we have utilized the current imaging tunneling spectroscopy (CITS) mode of the CP-AFM system. We have prepared a self-assembled monolayer of 1-decanethiol on Au(111) substrate where 4,4$'$-bis(mercaptomethyl)-trans-stilbene (BMMS) molecules have been incorporated. We demonstrate that we have constructed a conductivity map derived from a set of CITS data. Conductance peaks presumably involved by BMMS molecules have been found in the conductivity map and the corresponding $I$–$V$ curves have exhibited fluctuations in current. The causes of the current fluctuations are also discussed.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-07-15
著者
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Mizutani Wataru
Nanotechnology Research Institute (nri) National Institute Of Advanced Industrial Science And Techno
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Naitoh Yasuhisa
Nanotechnology Research Institute (nri) National Institute Of Advanced Industrial Science And Techno
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Azehara Hiroaki
Nanotechnology Research Institute (nri) National Institute Of Advanced Industrial Science And Techno
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Liang Tien-tzu
Nanotechnology Research Institute (nri) National Institute Of Advanced Industrial Science And Techno
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Ishida Takao
Nanotechnology Research Institute (nri) Aist
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Liang Tien-Tzu
Nanotechnology Research Institute (NRI), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Ishida Takao
Nanotechnology Research Institute (NRI), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Azehara Hiroaki
Nanotechnology Research Institute (NRI), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Azehara Hiroaki
Nanotechnology Research Center, Research Institute for Electronic Science (RIES), Hokkaido University, Sapporo 001-0021, Japan
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