Dependence of Electric Properties of a Nanogap Junction on Electrode Material
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概要
- 論文の詳細を見る
Oblique deposition was used to fabricate two metal electrodes separated by a gap of less than 10 nm on a SiO2 substrate. By sweeping voltage between these electrodes, a negative resistance change of several digits was observed in vacuum. In this work, electrodes made of Au, Pd, Pt, and Ta were fabricated, and their electric properties were measured in vacuum. The negative resistance was observed for all of the four metals. The result of the measurements clearly shows the correlation between the voltage at the minimum resistance and the melting point. Also, the calculated temperature rise shows a correlation with the melting point. These facts support the effect that the thermal change of the electrode metal has a considerable effect on the electric properties of the nanogap switch (NGS).
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2008-03-25
著者
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Naitoh Yasuhisa
Nanotechnology Research Institute (nri) National Institute Of Advanced Industrial Science And Techno
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Horikawa Masayo
Nanotechnology Research Institute (nri) National Institute Of Advanced Industrial Science And Techno
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Shimizu Tetsuo
Nanotechnology Research Institute National Institute Of Advanced Industrial Science And Technology
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Horikawa Masayo
Nanotechnology Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8562, Japan
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Furuta Shigeo
Funai Electric Advanced Applied Technology Research Institute Inc., Kawasaki 210-0855, Japan
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Takahashi Tsuyoshi
Funai Electric Advanced Applied Technology Research Institute Inc., Kawasaki 210-0855, Japan
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Ono Masatoshi
Funai Electric Advanced Applied Technology Research Institute Inc., Kawasaki 210-0855, Japan
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Shimizu Tetsuo
Nanotechnology Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8562, Japan
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