Estimation of Volume Lifetimes in Small Square Pillars of Silicon using Empirical Formulae

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概要

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• Effective lifetimes measured by the frequency-dependent surface photovoltage method, become, more or less, shorter than volume lifetimes in a square pillar because of the carrier recombination at the lateral surfaces of the pillar. The volume lifetime in the pillar can be estimated using empirical equations based on the position-dependent effective lifetimes on the pillar surface. Thus, the maximum effective lifetime of 18.1 ms in an n-type silicon pillar of $20\times 20\times 80$ mm3 corresponds to a volume lifetime of 22.7 ms. The estimated lifetime is, however, longer than that of 18.0 ms obtained by the photoconductive decay method. The reason for this is discussed.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2003-06-15

著者

• Ogawa Arito

  Department Of Electronics Tohoku Institute Of Technology

• Munakata Chusuke

  Department Of Electrical Engineering And Computer Sciences University Of California

• Ogawa Arito

  Department of Electronics, Tohoku Institute of Technology, 6 Futatsuzawa, Taihaku-ku, Sendai 982-8588, Japan

関連論文

• Estimation of Volume Lifetimes in Small Square Pillars of Silicon using Empirical Formulae
• Frequency Dependence of the Diffusion Length for Excess Minority Carriers Generated with a Pulsed Electron Beam
• Charge Storage Effect in the Microwave Detected Photoconductive Decay Method
• Effect of the Surface Recombination Velocity on the β-Conductive Signal
• Analysis of the β-Conductive Signal Excited with a Pulsed Electron Beam
• Separation between Surface and Volume Decay Times of Photoconductivity in p-Type Silicon Wafers
• Density Distribution Profiles of Excess Minority Carriers Injected with 904-nm-Wavelength Laser Pulse into 400-μm-Thick Silicon Wafer
• Lateral Size Effect in the Lifetime Measurement by Frequency-Dependent Surface Photovoltage Technique
• Charge Storage Effect in the Microwave Detected Photoconductive Decay Method
• Estimation of Volume Lifetimes in Small Square Pillars of Silicon using Empirical Formulae

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