Frequency Dependence of the Diffusion Length for Excess Minority Carriers Generated with a Pulsed Electron Beam

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1972-06-05

著者

• Everhart Thomas

  Department Of Electrical Engineering And Computer Sciences University Of California

• Munakata Chusuke

  Department Of Electronics Tohoku Institute Of Technology

• Munakata Chusuke

  Department Of Electrical Engineering And Computer Sciences University Of California

関連論文

• Estimation of Volume Lifetimes in Small Square Pillars of Silicon using Empirical Formulae
• Frequency Dependence of the Diffusion Length for Excess Minority Carriers Generated with a Pulsed Electron Beam
• Charge Storage Effect in the Microwave Detected Photoconductive Decay Method
• Effect of the Surface Recombination Velocity on the β-Conductive Signal
• Analysis of the β-Conductive Signal Excited with a Pulsed Electron Beam
• Separation between Surface and Volume Decay Times of Photoconductivity in p-Type Silicon Wafers
• Density Distribution Profiles of Excess Minority Carriers Injected with 904-nm-Wavelength Laser Pulse into 400-μm-Thick Silicon Wafer
• Lateral Size Effect in the Lifetime Measurement by Frequency-Dependent Surface Photovoltage Technique
• Charge Storage Effect in the Microwave Detected Photoconductive Decay Method
• Estimation of Volume Lifetimes in Small Square Pillars of Silicon using Empirical Formulae

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