Munakata Chusuke | Department Of Electrical Engineering And Computer Sciences University Of California

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概要

• 同名の論文著者
• Department Of Electrical Engineering And Computer Sciences University Of Californiaの論文著者

関連著者

• Munakata Chusuke

  Department Of Electrical Engineering And Computer Sciences University Of California

• Munakata Chusuke

  Department Of Electronics Tohoku Institute Of Technology

• Watanabe Kikuo

  Central Research Laboratory Hitachi Ltd.

• Suzuki Takumi

  Department Of Electronics Tohoku Institute Of Technology

• Everhart Thomas

  Department Of Electrical Engineering And Computer Sciences University Of California

• Ogawa Arito

  Department Of Electronics Tohoku Institute Of Technology

• Watanabe Kikuo

  Central Research Laboratory. Hitachi. Ltd.

• Kitagawara Yutaka

  SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd., 2-13-1 Isobe, Annaka, Gunma 379-0196, Japan

• Oiwa Nobutoshi

  Department of Electronics, Tohoku Institute of Technology, 6 Futatsuzawa, Taihaku-ku, Sendai 982-8588, Japan

• Kitagawa Yutaka

  SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd., 2-13-1 Isobe, Annaka, Gunma 379-0196, Japan

• Yoshida Tomosuke

  SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd., 2-13-1 Isobe, Annaka, Gunma 379-0196, Japan

• Yoshida Tomosuke

  SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd., 2-13-1 Isobe, Annaka, Gunma 379-0196, Japan

• Watanabe Kikuo

  Central Research Laboratory, Hitachi, Ltd., 1-280 Higashikoigakubo, Kokubunji, Tokyo 185-8601, Japan

• Ogawa Arito

  Department of Electronics, Tohoku Institute of Technology, 6 Futatsuzawa, Taihaku-ku, Sendai 982-8588, Japan

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著作論文

• Frequency Dependence of the Diffusion Length for Excess Minority Carriers Generated with a Pulsed Electron Beam
• Charge Storage Effect in the Microwave Detected Photoconductive Decay Method
• Effect of the Surface Recombination Velocity on the β-Conductive Signal
• Analysis of the β-Conductive Signal Excited with a Pulsed Electron Beam
• Separation between Surface and Volume Decay Times of Photoconductivity in p-Type Silicon Wafers
• Density Distribution Profiles of Excess Minority Carriers Injected with 904-nm-Wavelength Laser Pulse into 400-μm-Thick Silicon Wafer
• Lateral Size Effect in the Lifetime Measurement by Frequency-Dependent Surface Photovoltage Technique
• Charge Storage Effect in the Microwave Detected Photoconductive Decay Method
• Estimation of Volume Lifetimes in Small Square Pillars of Silicon using Empirical Formulae

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