Watanabe Kikuo | Central Research Laboratory Hitachi Ltd.

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概要

• WATANABE Kikuoの詳細を見る
• 同名の論文著者
• Central Research Laboratory Hitachi Ltd.の論文著者

関連著者

• Watanabe Kikuo

  Central Research Laboratory Hitachi Ltd.

• WATANABE Kikuo

  Central Research Laboratory, Hitachi Ltd.

• Munakata Chusuke

  Department Of Electrical Engineering And Computer Sciences University Of California

• Kikawa Takeshi

  Central Research Laboratory, Hitachi Ltd.

• Ando T

  Okayama Prefectural Univ. Okayama Jpn

• Watanabe Katsuyuki

  National Research Institute For Metals : Department Of Material Science And Technology Science Unive

• Watanabe K

  Department Of Physics Tokyo University Of Science

• AWAZU Koichi

  Electrotechnical Laboratory

• KAWAZOE Hiroshi

  Research Laboratory of Engineering Materials, Tokyo Institute of Technology

• ANDO Toshio

  Central Research Laboratory, Hitachi, Ltd.

• Kikawa Takeshi

  Central Research Laboratory Hitachi Ltd.

• Kushida Abdelghafar

  Central Research Laboratory Hitachi Ltd.

• Awazu K

  Electrotechnical Lab. Tsukuba‐shi

• Wakisaka K

  Sanyo Electric Co. Ltd. Hirakata‐shi Jpn

• Munakata Chusuke

  Department Of Electronics Tohoku Institute Of Technology

• Kawazoe H

  Tokyo Inst. Technol. Kanagawa Jpn

• Kawazoe Hiroshi

  Research Laboratory Of Engineering Materials Tokyo Institute Of Technology

• WATANABE Ken-ichi

  Institute for Nuclear Study, University of Tokyo

• Murakami Eiichi

  Semiconductor And Integrated Circuits Division Hitachi Ltd.

• KAMIGAKI Yoshiaki

  Central Research Laboratory, Hitachi, Ltd.

• Watanabe Kikuo

  Central Research Laboratory. Hitachi. Ltd.

• Kamigaki Yoshiaki

  Central Research Laboratory Hitachi Ltd.

• Ando Toshio

  Central Research Laboratory Hitachi Ltd.

• KIKAWA Takeshi

  Central Research Laboratory, Hitachi, Ltd.

• Watanabe Kikuo

  Central Research Laboratory, Hitachi, Ltd., 1-280 Higashikoigakubo, Kokubunji, Tokyo 185-8601, Japan

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著作論文

• Study of Oxygen-Deficient Centers in SiO_2 Films Using Photoluminescence Spectra
• Residual Interface Traps at Bird's Beaks of Field Oxide Layers
• Defect Termination by Nitrogen Bonding due to NO Nitridation in MOS Structures
• Charge Storage Effect in the Microwave Detected Photoconductive Decay Method
• Charge Storage Effect in the Microwave Detected Photoconductive Decay Method

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