KAMIGAKI Yoshiaki | Central Research Laboratory, Hitachi, Ltd.
スポンサーリンク
概要
関連著者
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KAMIGAKI Yoshiaki
Central Research Laboratory, Hitachi, Ltd.
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Minami Shin'ichi
Semiconductor & Integrated Circuits Hitachi Ltd. C
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Kamigaki Yoshiaki
Central Research Laboratory Hitachi Ltd.
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Furusawa Kazunori
The Semiconductor & Integrated Circuits Div. Hitachi Ltd.
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Kikawa Takeshi
Central Research Laboratory, Hitachi Ltd.
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Komori Kazuhiro
The Semiconductor & Integrated Circuits Div. Hitachi Ltd.
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WATANABE Kikuo
Central Research Laboratory, Hitachi Ltd.
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Kikawa Takeshi
Central Research Laboratory Hitachi Ltd.
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Kushida Abdelghafar
Central Research Laboratory Hitachi Ltd.
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Minami Shin-ichi
the Central Research Laboratory, Hitachi, Ltd.
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Ujiie Kazuaki
the Hitachi ULSI Engineering Corporation
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Terasawa Masaaki
the Hitachi ULSI Engineering Corporation
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Furusawa Kazunori
the Semiconductor & Integrated Circuits Div., Hitachi, Ltd.
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Kamigaki Yoshiaki
the Central Research Laboratory, Hitachi, Ltd.
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Murakami Eiichi
Semiconductor And Integrated Circuits Division Hitachi Ltd.
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Watanabe Kikuo
Central Research Laboratory Hitachi Ltd.
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Uchida K
The Hitachi Ulsi Engineering Corporation
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Hagiwara Takaaki
Musashi Works Hitachi Ltd.
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MINAMI Shin-ichi
Central Research Laboratory, Hitachi Ltd.
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UCHIDA Ken
Musashi Works, Hitachi Ltd.
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FURUSAWA Kazunori
Musashi Works, Hitachi Ltd.
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Uchida Ken
Musashi Works Hitachi Ltd.
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KIKAWA Takeshi
Central Research Laboratory, Hitachi, Ltd.
著作論文
- A 3 Volt 1 Mbit Full-Featured EEPROM Using a Highly-Reliable MONOS Device Technology (Special Section on High Speed and High Density Multi Functional LSI Memories)
- Defect Termination by Nitrogen Bonding due to NO Nitridation in MOS Structures
- MNOS Nonvolatile Semiconductor Memory Technology : Present and Future(Special Issue on Nonvolatile Memories)
- Improvement of Written-State Retentivity by Scaling Down MNOS Memory Devices : Silicon Devices and Process Technologies(Solid State Devices and Materials 1)