Lateral Size Effect in the Lifetime Measurement by Frequency-Dependent Surface Photovoltage Technique
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概要
- 論文の詳細を見る
Effective lifetimes measured with the frequency-dependent surface photovoltage method, decrease in proportion to the quantity of excess carriers escaping from the photocarrier injection point towards the lateral surfaces where they recombine. It has been experimentally found that the separation between the sandpaper-lapped surfaces and the photocarrier injection point has to be longer than 8 times the diffusion length $L$ of minority carriers in order to keep measurement errors under 10%, while it may be more than 1.4$L$ for the chemically etched surfaces.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2003-01-15
著者
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Munakata Chusuke
Department Of Electrical Engineering And Computer Sciences University Of California
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Kitagawara Yutaka
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd., 2-13-1 Isobe, Annaka, Gunma 379-0196, Japan
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Oiwa Nobutoshi
Department of Electronics, Tohoku Institute of Technology, 6 Futatsuzawa, Taihaku-ku, Sendai 982-8588, Japan
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Kitagawa Yutaka
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd., 2-13-1 Isobe, Annaka, Gunma 379-0196, Japan
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Yoshida Tomosuke
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd., 2-13-1 Isobe, Annaka, Gunma 379-0196, Japan
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Yoshida Tomosuke
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd., 2-13-1 Isobe, Annaka, Gunma 379-0196, Japan
関連論文
- Frequency Dependence of the Diffusion Length for Excess Minority Carriers Generated with a Pulsed Electron Beam
- Charge Storage Effect in the Microwave Detected Photoconductive Decay Method
- Effect of the Surface Recombination Velocity on the β-Conductive Signal
- Analysis of the β-Conductive Signal Excited with a Pulsed Electron Beam
- Separation between Surface and Volume Decay Times of Photoconductivity in p-Type Silicon Wafers
- Density Distribution Profiles of Excess Minority Carriers Injected with 904-nm-Wavelength Laser Pulse into 400-μm-Thick Silicon Wafer
- Lateral Size Effect in the Lifetime Measurement by Frequency-Dependent Surface Photovoltage Technique
- Charge Storage Effect in the Microwave Detected Photoconductive Decay Method
- Estimation of Volume Lifetimes in Small Square Pillars of Silicon using Empirical Formulae