Novel Large-Area High-Resolution-Transmission-Electron-Microscopy Technique using Specimens Fabricated by a Focused Ion Beam Apparatus
スポンサーリンク
概要
- 論文の詳細を見る
A novel large-area high-resolution-transmission-electron-microscopy (LA-HRTEM) specimen fabrication technique using a focused ion beam (FIB) apparatus was developed. Using this technique, the cation composition in a K–Al–Si–Sn–Ti–Zr–O specimen was analyzed by energy dispersive X-ray spectroscopy (EDS). The cation composition of regions located more than 200 nm away from the interface between a ZrO2 grain and SiO2 matrix was the same as that in ZrO2 and SiO2. This indicates that the accuracy of EDS analyses in the LA-HRTEM specimens was confirmed.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-02-28
著者
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Udo Koichi
Department Of Dental Materials Science Nagasaki University
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Yamauchi Hisao
Material And Structures Laboratory Tokyo Institute Of Technology
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Suematsu Hisayuki
Materials And Structures Laboratory Tokyo Institute Of Technology
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Yatsui Kiyoshi
Extreme Energy Density Research Institute Nagaoka University Of Technology
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Hisatsune Kunihiro
Department Of Dental And Biomedical Materials Science Unit Of Basic Medical Sciences Graduate School
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Hisatsune Kunihiro
Department of Dental Materials Science, Nagasaki University, Nagasaki 852-8588, Japan
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Yamauchi Hisao
Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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Suematsu Hisayuki
Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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