T0401-2-3 集中質量型カンチレバーの接触共振による金属ナノ材料の弾性計測(金属ナノ材料の創製と展開(2))

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This study demonstrates measurement of elastic modulus of nanowires by means of atomic force acoustic microscopy with a concentrated-mass (CM) cantilever. CM cantilevers enhance the sensitivity of the contact resonance of a cantilever to a sample elasticity and make ease in evaluating Young's modulus. A relationship between the contact resonant frequency and the effective Young's modulus of sample was determined from measurements of reference surfaces, quartz wafer (Z plane), Si (111) and sapphire (0001). Aggregation of CuO nanowires, which forms a film on a quartz wafer, was prepared by scraping an oxidized surface of a copper wire with the wafer edge. The measurement of contact resonant frequency for the film-like nanowire aggregation resulted in reproducible evaluation of the effective Young's modulus of CuO nanowires
2009-09-12