Performance Evaluation of Fully-Depleted SOI MOSFET-Based Diodes Applied to Schenkel Circuit for RF-ID Chips
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概要
- 論文の詳細を見る
The feasibility of using the SOI-MOSFET as a quasi-diode to replace the Schottky-barrier diode (SBD) in the Schenkel circuit is examined by experiments and simulations. Unlike the SBD, the reverse-biased current of the SOI-MOSFET-based quasi-diode is much lower than its forward-biased current (I_F). The driving current of the quasi-diode (I_F) is increased by the excellent subthreshold swing value (S) of the SOI MOSFET ; the trade-off between boost-up efficiency (η) and I_F should be taken into account. An a. c. analysis indicates that the channel-doping level of the quasi-diode should be optimized to suppress the floating-body effect for RF applications.
- 関西大学の論文
著者
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Omura Yasuhisa
Ordist Dept. Electronics Kansai University
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Iida Yukio
Ordist Dept. Electronics Kansai University
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TAMURA Takuta
ORDIST Dept. Electronics, Kansai University
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NAMURA Shigeo
ORDIST Dept. Electronics, Kansai University
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Tamura Takuta
Ordist Dept. Electronics Kansai University
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Namura Shigeo
Ordist Dept. Electronics Kansai University:(present Office)glory Corp
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Omura Yasuhisa
ORDIST and Graduate School of Engineering, Kansai University, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan
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Omura Yasuhisa
ORDIST and Graduate School of Engineering Science, Kansai University, Suita, Osaka 564-8680, Japan
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