Determination of Otical Constants of Thin Films from Measurements of Reflectance and Transmittance
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-09-15
著者
-
Kim Won
Materials Design Laboratory Koreainstitute Of Science And Technology
-
LEE Taek
Thin Film Materials Research Center, Korea Institute of Science and Technology
-
CHUNG Moonkyo
Materials Science and Technology Division, Korea Institute of Science and Technology
-
LEE Taek
Materials Science and Technology Division, Korea Institute of Science and Technology
-
CHEONG Byung-ki
Materials Science and Technology Division, Korea Institute of Science and Technology
-
KIM Soon
Materials Science and Technology Division, Korea Institute of Science and Technology
-
Cheong Byung-ki
Thin Film Materials Research Center Korea Institute Of Science And Technology
-
BIE Qingshan
Materials Design Laboratory, KoreaInstitute of Science and Technology
-
LIN Zhensu
Physics Department, University of Missouri-Rolla
-
Lee Taek
Thin Film Materials Research Center Korea Institute Of Science And Technology
-
Chung Moonsung
Department Of Physics University Of Ulsan
-
Bie Qingshan
Materials Design Laboratory Koreainstitute Of Science And Technology:national Laboratory Of Solid St
-
Lin Zhensu
Physics Department University Of Missouri-rolla
-
Kim Sang
Materials Design Laboratory Koreainstitute Of Science And Technology
-
Bie Qingshao
Materials Design Laboratory, KoreaInstitute of Science and Technology:National Laboratory of Solid State Microstructures, Nanjing University:Department of Computer Science, University of Missouri-Rolla
関連論文
- A Single Element Phase Change Memory(Session 8A : Memory 2)
- A Single Element Phase Change Memory(Session 8A : Memory 2)
- Reduction of the threshold voltage fluctuation in an electrical phase change memory device with a Ge_1Sb_2Te_4 / TiN cell structure
- Lower Voltage Operation of a Phase Change Memory Device with a Highly Resistive TiON Layer
- Analysis of Read-out Signals in Land/Groove Recording of a Phase-Change Optical Disc
- Determination of Otical Constants of Thin Films from Measurements of Reflectance and Transmittance
- Spectroscopic Ellipsometry Studies of Cd_Mn_x Te Films Grown on GaAs : Semiconductors
- Second-Harmonic Generation of GaAlAs Diode Laser by Enhanced Doubling in LiIO_3 Crystal
- High Speed Phase Change Random Access Memory with (Ge1Sb2Te4)0.9(Sn1Bi2Te4)0.1 Complete Solid Solution
- A Single Element Phase Change Memory
- Origin of Nonlinear Optical Characteristics of Crystalline Ge–Sb–Te Thin Films for Possible Superresolution Effects
- Lower Voltage Operation of a Phase Change Memory Device with a Highly Resistive TiON Layer