Spectroscopic Ellipsometry Studies of Cd_<1-x>Mn_x Te Films Grown on GaAs : Semiconductors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2001-09-15
著者
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Chung Moonsung
Department Of Physics University Of Ulsan
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HWANG Younghun
Department of Physics, University of Ulsan
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KIM Hyekyeong
Department of Physics, University of Ulsan
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UM Youngho
Department of Physics, University of Ulsan
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PARK Hyoyeol
Department of Physics, University of Ulsan
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YOO Pyoungkil
Department of Physics, University of Ulsan
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Um Youngho
Department Of Physics University Of Ulsan
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Park Hyoyeol
Department Of Physics University Of Ulsan
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Kim Hyekyeong
Department Of Physics University Of Ulsan
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Yoo Pyoungkil
Department Of Physics University Of Ulsan
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Hwang Younghun
Department Of Physics University Of Ulsan
関連論文
- Analysis of Read-out Signals in Land/Groove Recording of a Phase-Change Optical Disc
- Determination of Otical Constants of Thin Films from Measurements of Reflectance and Transmittance
- Spectroscopic Ellipsometry Studies of Cd_Mn_x Te Films Grown on GaAs : Semiconductors