Electron Energy-Loss Spectroscopy and Energy-Filtered Imaging of C_<60> Thin Films

概要

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Electron energy-loss spectra and energy filtered images have been obtained from C_<60> film deposited on Si(100) substrate using a serial electron energy loss spectrometer equipped on a scanning transmission electron microscope. The electron energy loss spectra of the specimen in the low loss region reveals the plasmon energies of C_<60> to be 6.6 eV and 25.3 eV. Energy-filtered images obtained at energy-losses corresponding to zero-loss, plasmon energies of Si and C__<60>, and core loss energies of Si and C__<60> clearly demonstrate the elemental mapping capabilities of the energy-filtered imaging technique. Energy-filtered selected area diffraction pattern indicates that the film is amorphous, i.e., the C_<60> molecules are randomly arranged on the Si substrate, with a mean intermolecular spacing of 9.9±0.2A.
社団法人応用物理学会の論文
1998-05-01