X-ray Fluorescence Analysis of Rare-Earth Atoms in Materials by Use of Ultrashort Wavelength X-rays

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概要

• 論文の詳細を見る

• A new technique of X-ray fluorescence analysis using ultrashort-wavelength X-rays was tested to obtain the K-series of spectra for rare-earth elements in two different kinds of materials, i.e. powder samples of rare-earth oxides and single crystals of rare-earth hexaborides. This technique utilizes a solid-state detector and multichannel pulse-height analyzer, and satisfies the requirements for quantitative identification in samples containing heavy elements. This technique was applied to determine the composition of the mixed compound La_<1-x>Ce_xB_6(x = 0.25, 0.50 and 0.75). There is good agreement, within the limits of experimental error, between the values thus obtained and the nominal values.

• 社団法人応用物理学会の論文
• 1998-05-01

著者

• YUKINO Ken

  National Institute for Research in Inorganic Materials

• TAKAHASHI Yasuhiko

  Institute of Applied Physics,University of Tsukuba

• OKAMURA Fujio

  National Institute for Research in Inorganic Materials

• Ohshima Ken-ichi

  Institute Of Applide Physics University Of Tsukuba

• Yamamoto Kazuki

  Department Of Physics Nara Women's University

• Yamamoto Kazuki

  Department Of Neurosurgery Kobe University Graduate School Of Medicine

• Yamamoto Kazuki

  Department Of Neurosurgery Kobe Children's Hospital

• Takahashi Yasuhiko

  Institute Of Applied Physics University Of Tsukuba

• Okamura Fujio

  National Institute for Research in Inorganic Material

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