The Characterization of Traps in Semi-Insulating Gallium Arsenide Buffer Layers Grown at Low Temperature by Molecular Beam Epitaxy with an Improved Zero-Bias Thermally Stimurated Current Technique
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1991-11-01
著者
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Tan Leng
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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CHONG Tow
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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LAU Wai
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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GOO Chuen
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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GOH Kian
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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Lau W
Lam Res. Corp. California Usa
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Goh Kian
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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Goo C
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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Chong T
National Univ. Singapore Singapore
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Chong Tow
Data Storage Institute
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Lau Wai
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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Chong Tow
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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Chong Tow
Data Storage Institute, DSI Building
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- On the Possibility of High Density Data Storage Based on Modulation-Doped Electron Trapping Materials
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