Lau Wai | Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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概要
- 同名の論文著者
- Centre For Optoelectronics Department Of Electrical Engineering National University Of Singaporeの論文著者
関連著者
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Lau Wai
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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Lau W
Lam Res. Corp. California Usa
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LAU Wai
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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Chong T
National Univ. Singapore Singapore
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Chong Tow
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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CHONG Tow
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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Chong Tow
Data Storage Institute
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Chong Tow
Data Storage Institute, DSI Building
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Tan Leng
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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PHUA Cheng
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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ZHAO Rong
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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GOO Chuen
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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Lau Wai
Department Of Electrical Engineering National University Of Singapore
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Goo C
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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Phua Cheng
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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Phua C
Data Storage Institute
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CHU Paul
Department of Physics and Materials Science, City University of Hong Kong
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Chu P
City Univ. Hong Kong Hong Kong Chn
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Chu Paul
Department Of Physics And Materials Science City University Of Hong Kong
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Qian Peng
Department Of Electrical Engineering National University Of Singapore
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Chong T
Data Storage Inst. Singapore
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Zhao R
Nus Singapore
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Zhao Rong
Centre For Optoelectronics Faculty Of Engineering National University Of Singapore
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Sandler N
Lam Research Corporation Cvd Business Unit
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SANDLER Nathan
Lam Research Corporation, CVD Business Unit
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LU Dong
Institute of Microelectronics, National University of Singapore
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GOH Kian
Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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Lau Wai
Centre For Optoelectronics Faculty Of Engineering National University Of Singapore
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Goh Kian
Centre For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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Lim Hui
Centre For Optoelectronics Faculty Of Engineering National University Of Singapore Philips Singapore
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Li M
National Univ. Singapore Sgp
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ZHAO Rong
Center for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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LAU Wai
Center for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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CHONG Tow
Center for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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LI Ming
Center for Optoelectronics, Department of Electrical Engineering, National University of Singapore
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Lu Dong
Institute Of Microelectronics National University Of Singapore
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Kek Soon
Centre For Optoelectronics Faculty Of Engineering National University Of Singapore Texas Instruments
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MCKINLEY Kevin
Lam Research Corporation, CVD Business Unit
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KHAW Kee
Department of Electrical Engineering, National University of Singapore
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SANDLER P.
Lam Research Corporation, CVD Division
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Li Ming
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Aziz Wan
Centre For Optoelectronics Faculty Of Engineering National University Of Singapore
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Chor Eng
Centre For Optoelectronics Faculty Of Engineering National University Of Singapore
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Khaw Kee
Department Of Electrical Engineering National University Of Singapore
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Chu Paul
Charles Evans & Associates
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Mckinley Kevin
Lam Research Corporation Cvd Business Unit
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HENG Chun
Centre for Optoelectronics, Faculty of Engineering, National University of Singapore
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Heng Chun
Centre For Optoelectronics Faculty Of Engineering National University Of Singapore
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Tung Chih
Institute Of Microelectronics Department Of Failure Analysis And Reliability
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PERERA Merinnage
Department of Electrical Engineering, National University of Singapore
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BABU Premila
Department of Electrical Engineering, National University of Singapore
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OW Aik
Department of Electrical Engineering, National University of Singapore
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HAN Taejoon
Lam Research Corporation, CVD Business Unit
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SHENG Tan
Institute of Microelectronics, Department of Failure Analysis and Reliability
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Ow Aik
Department Of Electrical Engineering National University Of Singapore
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Sheng Tan
Institute Of Microelectronics Department Of Failure Analysis And Reliability
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Han Taejoon
Lam Research Corporation Cvd Business Unit
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Babu Premila
Department Of Electrical Engineering National University Of Singapore
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Li Ming
Center For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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Perera Merinnage
Department Of Electrical Engineering National University Of Singapore
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Lau W.
Department Of Chemical Engineering National Universityt Of Singapore
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Lau W.
Department Of Electrical Engineering National University Of Singapore
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Perea Merinnage
Department of Electrical Engineering, National University of Singapore
著作論文
- Application of Semiconducting Low Temperature Grown GaAs to Improve Laser Diodes Grown on Si Substrates
- The Characterization of Traps in Semi-Insulating Gallium Arsenide Buffer Layers Grown at Low Temperature by Molecular Beam Epitaxy with an Improved Zero-Bias Thermally Stimurated Current Technique
- The Application of Semiconducting Low-Temperature Grown GaAs to Improve Laser Diodes Grown on Si Substrates
- A Comparison of the Selective Etching Characteristics of Conventional and Low-Temperature-Grown GaAs over AlAs by Various Etching Solutions
- Evidence that N_2O is a Stronger Oxidizing Agent than O_2 for the Post-Deposition Annealing of Ta_2O_5 on Si Capacitors
- A Comparison of Defect States in Tantalum Pentoxide (Ta_2O_5) Films after Rapid Thermal Annealing in O_2 or N_2O by Zero-Bias Thermally Stimulated Current Spectroscopy
- Improved Crystalline Quality of Molecular Beam Epitaxy Grown GaAs-on-Si Epilayer through the Use of Low-Temperature GaAs Intermediate Layer
- Quantitative Detection of Oxygen Contamination Related Traps in Gallium Arsenide Epitaxial Layer Grown by Molecular Beam Epitaxy at Low Temperature
- The Development of a Highly Selective KI/I_2/H_2O/H_2SO_4 Etchant for the Selective Etching of Al_Ga_As over GaAs
- The Superiority of N_2O Plasma Annealing over O_2 Plasma Annealing for Amorphous Tantalum Pentoxide (Ta_2O_5) Films
- The Identification and Suppression of Defects Responsible for Electrical Hysteresis in Metal-Nitride-Silicon Capacitors