Stable Passivation Systems for GaAs Prepared by Room-Temperature Deposition of SiO_2 Films
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-07-15
著者
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HASHIZUME Tamotsu
Hokkaido University
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Hashizume Tamotsu
Hokkaido Polytechnic College
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Yoshino Masaki
Hokkaido Polytechnic College
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SHIMOZUMA Mitsuo
College of Medical Technology, Hokkaido University
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ISHIKAWA Motohiro
Department of Electrical Engineering, Faculty of Engineering, Hokkaido University
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Shimozuma Mitsuo
College Of Medical Technology Hokkaido University
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Ishikawa Motohiro
Department Of Electrical Engineering Faculty Of Engineering Hokkaido University
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- Fabrication and Characterization of Active and Sequential Circuits Utilizing Schottky-Wrap-Gate-Controlled GaAs Hexagonal Nanowire Network Structures
- Formation of Oxide-Free Nearly Ideal Pt/GaAs Schottky Barriers by Novel In Situ Photopulse - Assisted Electrochemical Process
- Ionization Coefficient in Gases under Nonuniform Electric Fields
- Modeling of the electron kinetics in proportional counters
- Stable Passivation Systems for GaAs Prepared by Room-Temperature Deposition of SiO_2 Films
- Process-Induced Defects in InP Caused by Chemical Vapor Deposition of Surface Passivation Dielectrics
- Deep Level Characterization of Submillimeter-Wave GaAs Schottky Diodes Produced by a Novel In-Situ Electrochemical Process
- Properties of TiN Films on Heated Substrate Below 550℃ by 50 Hz Plasma-Enhanced Chemical Vapor Deposition
- Annealing Behavior of HF-Treated GaAs Capped with SiO_2 Films Prepared by 50-Hz Plasma-Assisted Chemical Vapor Deposition
- FOREWORD