Anisotropic Ridge Growth by Step-Flow-Mode Metalorganic Chemical Vapor Deposition Using Diethylgalliumchloride
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概要
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In selective metalorganic chemical vapor deposition, ridge growth of GaAs was investigated with respect to step-flow-mode growth using diethylgalliumchloride. Although the flat surface of selective epilayers was easy to obtain due to the reevaporation-enhancement effect, anisotropic ridged layers were also observed. The growth form of the ridged layers depended upon crystal orientation of striped mask patterns, off-angle of vicinal (100) substrates and step-flow velocity. Step-flow velocity in the [011] direction was 1.6 times higher than that in the [01^^-1] direction; as a result, long ridged layers were formed along the [011] direction.
- 社団法人応用物理学会の論文
- 1993-11-15
著者
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Okamoto Kotaro
Department Of Electronics Engineering Shizuoka University
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Okamoto Kotaro
Department Of Communication Engineering University Of Electro-communications
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Okamoto Kotaro
Department Of Electronic Engineering University Of Electro-communications
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Yamaguchi Ko-ichi
Department Of Electronics Engineering Shizuoka University
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Yamaguchi Ko-ichi
Department Of Electronic Engineering The University Of Electro-communications
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- Anisotropic Ridge Growth by Step-Flow-Mode Metalorganic Chemical Vapor Deposition Using Diethylgalliumchloride
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