Transmission Electron Microscope Observation of Mechanically Damaged InGaAsP/InP Double-Heterostructure Light-Emitting Diode
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1980-05-05
著者
-
Ueda Osamu
Fujitsu Laboratories Ltd.
-
Ueda Osamu
Institute Of Pharmaceutical Science Hiroshima University School Of Medicine
-
Ueda Osamu
Fujitsu Laboratories Lid.
-
YAMAOKA Toyoshi
Fujitsu Ltd.
-
YAMAKOSHI Shigenobu
Fujitsu Laboratories Ltd.
-
Yamakoshi Shigenobu
Fujitsu Laboratories Limited
-
Yamaoka Toyoshi
Fujitsu Laboratories
-
Yamaoka Toyoshi
Fujitsu Laboratories Ltd.
関連論文
- Further Metabolism of 2-Formylaminofluorene, a Metabolite of 2-Aminofluorene, in Rats
- ROLE OF MAMMALIAN TISSUES AND INTESTINAL BACTERIA IN N-ACYLATION
- Metabolism of Nitropolycyclic Aromatic Hydrocarbons in Animals, Fish and Intestinal Bacteria (Proceedings of the 18th Symposium on Toxicology, and Environmental Health)
- Deacylation of N-Formylanilines and N-Acetylanilines by Rat Liver Formamidase
- Defect Issues in III-V Alloy Semiconductors and Their Influence on the Degradation of Optical Devices
- High Two-Dimensional Electron Gas Mobility Enhanced by Ordering in InGaAs/N-InAlAs Heterostructures Grown on (110)-Oriented InP Substrates by Molecular Beam Epitaxy
- Transmission Electron Microscopic Observation of Misfit Dislocation in InP/InGaAsP Double -Heterostructures
- Observation of Atomic Steps on Vicinal Si(111) Annealed in Hydrogen Gas Flow by Scanning Tunneling Microscopy
- Control of GaAs on Si Interface Using Atomic Layer Epitaxy
- Observation of Atomic Structure by Scanning Tunneling Microscopy of Vicinal Si(100) Surface Annealed in Hydrogen Gas
- 5.6 ps Gate Delay All Refractory Josephson OR Gate with Modified Variable Threshold Logic
- TEM Observation of Dark Defects Appearing in InGaAsP/InP Double-Heterostructure Light Emitting Diodes Aged at High Temperature
- Transmission Electron Microscope Observation of Mechanically Damaged InGaAsP/InP Double-Heterostructure Light-Emitting Diode
- TEM Investigation of Dislocation Loops in Undoped InGaAsP and InGaP Layers Grown by Liquid Phase Epitaxy
- Composition-Modulated Structures in InGaAsP and InGaP Liquid Phase Epitaxial Layers Grown on (001) GaAs Substrates
- Comparison of Defect Formation in InGaAsP/InP and GaAlAs/GaAs : B-2: LD AND LED-1
- Power Dependence on Repetition Time of the Q-Switched CO_2 Laser
- Transmission Electron Microscope Study of Defects in Cd-Diffused n-InP Substrates
- Current Injection Effects in a Nb/AlO_x-Al/Nb/n-InSb Triode
- 9 ps Gate Delay Josephson OR Gate with Modified Variable Threshold Logic
- Two Step Photoconductive Decay of Ge:Hg Detectors
- The Degeneracy of Hg Level in Ge
- Two Step Photoconductive Decay of P-InSb by CO_2 Laser Light
- Atomic Structure of Ordered InGaP Crystals Grown on (001)GaAs Substrates by Metalorganic Chemical Vapor Deposition
- Slow Degradation Mechanism of GaAlAs Light-Emitting Diodes : B-3: LASER
- Measurement of Grey Zone of a Josephson SFQ Memory Cell