Application of a Digital Scanning Laser Microscope to 3-D Analysis of Contact Surface Damages(<Special Issue>Recent Development of Electro-Mechanical Devices (IS-EMD 2002))
スポンサーリンク
概要
- 論文の詳細を見る
The authors have been interested in a Scanning Laser Microscope (SLM) and applied it to studies of contact phenomena. In particular, a digital SLM is being currently used, and confirmed to be a successful tool for investigating the contact phenomena. In this paper, the theory and mechanism of a digital SLM are briefly explained, and some actual data obtained with the digital SLM are presented for demonstrating its usefulness for studies of contact phenomena.
- 社団法人電子情報通信学会の論文
- 2003-06-01
著者
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SAWA Koichiro
Keio University
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HASEGAWA Makoto
Chitose Institute of Science and Technology
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Sawa K
Nippon Institute Of Technology
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Hasegawa Makoto
Chitose Inst. Of Sci. And Technol. Hokkaido Jpn
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Hasegawa M
Integrated Information Processing Center Niigata University
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MAKIMOTO Jiro
Keio Univ.
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Sawa Koichiro
Keio Univ. Yokohama‐shi Jpn
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Hasegawa Makoto
Chitose Inst. Of Sci. And Technol. Chitose‐shi Jpn
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