Degradation phenomenon of electrical contacts by 3-D oscillating mechanism : Basal characteristic of 3-D oscillating mechanism
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概要
- 論文の詳細を見る
The authors have developed the 3-D oscillation mechanism which expanded 1-D oscillation mechanism, that is to say "hammering oscillating mechanism" and "sliding contact mechanism", into 3-D. And the fundamental characteristics of the mechanism are obtained, such as accelerations, displacements at various frequencies, output wave forms to sinusoidal inputs, and mechanical interferences with the X, Y, and Z-directions of the stage. Experimental results suggested that the mechanism could detect more real degradation phenomenon on contacts by the influences of micro-vibration. However, it is necessary that the mechanism should be improved, for instance, in precision mechanism and in feedback control.
- 社団法人電子情報通信学会の論文
- 2008-11-08
著者
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SAWA Koichiro
Keio University
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WADA Shin-ichi
R & D Division, TMC System Co. Ltd.
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KOSHIDA Keiji
R & D Division, TMC System Co. Ltd.
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SONODA Taketo
R & D Division, TMC System Co. Ltd.
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KIKUCHI Mitsuo
R & D Division, TMC System Co. Ltd.
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KUBOTA Hiroaki
R & D Division, TMC System Co. Ltd.
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Kubota Hiroaki
R & D Division Tmc System Co. Ltd.
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Sawa Koichiro
Keio University:nippon Institute Of Technology
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Sawa Koichiro
Nippon Institute Of Technology:keio University
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Sonoda Taketo
R & D Division Tmc System Co. Ltd.
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Koga Kei
Tmc System Co. Ltd.
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Wada Shin-ichi
Tmc System Co. Ltd.
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Kikuchi Mitsuo
R & D Division Tmc System Co. Ltd.
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MINEGISHI Hiroto
R & D Department., TMC System Co., Ltd.
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KOBAYASHI Yukiharu
R & D Department., TMC System Co., Ltd.
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SAWA Koichiro
K-201,Shin-Kawasaki Town Campus, Keio University
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Minegishi Hiroto
R & D Department. Tmc System Co. Ltd.
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Kobayashi Yukiharu
R & D Department. Tmc System Co. Ltd.
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