Investigation on the Possible Electric Field Effect and Surface Morphology of a YBCO/CeO_2/Au MIS Diode (Special Issue on High-Temperature Superconducting Electronics)
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概要
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A YBCO / CeO_2 / Au MIS structure (YBCO:YBa_2Cu_3O_<7-y>) is fabricated on a MgO(100) substrate with the help of the all-in-situ electron-beam and heater coevaperation system. The current-voltage (I-V) characteristics of the deposited YBCO film under various gate voltages are examined. Small modulation of the I-V characteristics by gate voltages can be observed. Meanwhile, the surface morphology is also studied by means of an atomic force microscope (AFM). The relation between the field effect and the surface morphology of a thin YBCO film is discussed.
- 社団法人電子情報通信学会の論文
- 1993-08-25
著者
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Wang Qian
Institute Of Materials Science University Of Tsukuba
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Iguchi I
Institute Of Materials Science University Of Tsukuba
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Iguchi Ienari
Department Of Physics And Crest-jst Tokyo Institute Of Technology
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Iguchi Ienari
Department Of Applied Physics Tokyo Institute Of Technology:crest Japan Science And Technology Corpo
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Iguchi Ienari
Institute Of Materials Science University Of Tsukuba
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Iguchi Ienari
Department. Of Applied Physics Tokyo Institute Of Technology
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Iguchi Ienari
The Department Of Applied Physics Tokyo Institute Of Technology
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Iguchi Ienari
Department Of Applied Physics Tokyo Institute Of Technology
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Wang Qian
Institute Of Advanced Material Study 86 Kyushu University
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