X-Ray Diffuse Scattering by Highly Oriented Pyrolytic Graphite
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概要
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The X-ray diffuse scattering intensity was measured for a highly oriented pyrolyticgraphite (HOPG) sample as well as for a single crystal kish graphite sample. The meas-urements were carried out both at 10 K and at room temperatttre. The HOPG samplegives rise to a temperature independent diffuse scattering along the c'-direction. Thisscattering was analyzed as that due to the crystallite boundaries. The thermal diffusescattering exhibits unusual features which could be interpreted to be a result of thecoupling of low frequency phonons with an excitation mode which is yet to be iden-tified.pyrolytic graphite, defect, X-ray diffuse scattering
- 社団法人日本物理学会の論文
- 1990-03-15
著者
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WAKABAYASHI Nobuyoshi
Department of Physics, Faculty of Science and Technology, Keio University
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Tamaki Teruyuki
Department Of Physics Faculty Of Science And Technology Keio University
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Wakabayashi Nobuyoshi
Department Of Physics Faculty Of Science And Technology Keio University
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