Time Dependence and Excitation-Intensity Dependence of Luminescence in CdTe
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概要
- 論文の詳細を見る
Transient behavior of luminescence has been measured in high-purity CdTein the 17-82 K temperature range using a mode-locked Kr' laser as the excitationsource. The presence of the bott[eneck of the excitonic polariton has been clearlyobserved in the wavelength dependence of the luminescence decay time. It hasalso been found that when the excitation density is varied, the spectral shape as wet las the efficiency of the polariton luminescence change, while the decay timeremains almost constant. Mechanisms of the relaxation following the photo-excitation are discussed.
- 社団法人日本物理学会の論文
- 1984-11-15
著者
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KUSHIDA Takashi
Department of Physics, Osaka University
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Hongo Shozo
Department Of Electrical Engineering Faculty Of Engineering Osaka University:(present Address) Depar
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Hongo Shozo
Department Of Electronic Engineering Kobe University
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OHTSUKI Tomoko
Department of Physics,Faculty of Science,Osaka University
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Ohtsuki Tomoko
Department Of Physics Osaka University:science Institute Ibm Japan Ltd.
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Ohtsuki Tomoko
Department Of Physics Faculty Of Science Osaka University
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Kushida Takashi
Department Of Physics Faculty Of Science Osaka University
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BO Hiroshi
Department of Electronic Engineering, Faculty of Engineering, Kobe University
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Bo Hiroshi
Department Of Electronic Engineering Kobe University
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Bo Hiroshi
Department Of Electrical Engineering Kobe University
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