Fe-Cr 合金において表面偏析および大気酸化により形成した表面層の角度分解 XPS 解析

概要

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Angle-resolved X-ray photoelectron spectroscopy (AR-XPS) was used for characterizing thin layers formed on iron-chromium alloys by surface segregation at 973K and subsequent expossure to air. Effective thickness and chromium concentration in the segregated layer are estimated by coupling with a model. It is suggested that the chromium concentration in the segreagted layer is a few times as much as the bulk concentration, and the thickness is a few atomic layers. It is found that the oxide layer formed by the subsequent expossure to air is thicker than the chromium segregated layer. Spectral information suggests that the surface segregation of chromium suppresses the oxidation in iron-chromium alloys.Iron-chromium alloysSurface segregationAngle-resolved X-ray photoelectron spectroscopyOxidation
東北大学の論文