Highly Efficient InGaN-Based 383-nm Ultraviolet Light-Emitting Diodes Fabricated on Sapphire Substrate Using High-Temperature-Grown AlN Buffer
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概要
- 論文の詳細を見る
- 2008-10-25
著者
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Ohba Yasuo
Corporate Research And Development Center Toshiba Corporation
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Kaneko Kei
Corporate Research & Development Center Toshiba Corporation
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KUSHIBE Mitsuhiro
Corporate Research and Development Center, Toshiba Corporation
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KATSUNO Hiroshi
Corporate Research and Development Center, Toshiba Corporation
関連論文
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