Effective Prevention of Single Event Burnout for N-Channel Power MOSFETs
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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Lai Yeong-lin
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Lai Yeong-lin
Department Of Mechatronics Engineering National Changhua University Of Education
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Huang Chih-yen
Department Of Electronic Engineering Feng Chia University
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