Plasma-Enhanced Chemical Vapor Deposition Growth of Fluorinated Amorphous Carbon Thin Films Using C_4F_8 and Si_2H_6/He for Low-Dielectric-Constant Intermetallic-Layer Dielectrics
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-07-15
著者
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SHIN Jang-Kyoo
Department of Electronics, Kyungpook National University
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Shin Jang-kyoo
Department Of Electronics Kyungpook National University
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Lee Gil
Department Of Information And Communications Gist:(present Office)sc Management Center Sumsung Elect
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Lee Gil
Department Of Electrical Engineering University Of Texas At Dallas
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Kwon Dae-hyuk
School Of Electronic And Information Engineering Kyungil University
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KIM Howoon
Department of Electronics, Kyungpook National University
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SEO Hwa-Il
School of Information Technology, Korea University of Technology and Education
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