Structural and Dielectric Properties of the BaTi_5O_<11> Thin Film Grown on the Poly-Si Substrate using RF Magnetron Sputtering
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-08-15
著者
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NAHM Sahn
Department of Materials Science and Engineering, Korea University
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Jang Bo-yun
Department Of Materials Science And Engineering Korea University
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Lee Hwack-joo
New Materials Evaluation Center Korea Research Institute Of Standards And Science
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Lee W‐s
Korea Electronics Technology Institute
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Lee Su-jae
Laboratory Of Radiation Effect Korea Cancer Center Hospital
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Yoo M‐j
Korea Electronics Technology Institute
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Yoo Myong-jae
Korea Electronics Technology Institute
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GANG Nam-Gi
Korea Electronics Technology Institute
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LEE Woo-Sung
Korea Electronics Technology Institute
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JEONG Young-Hun
Department of Materials Science and Engineering, Korea University
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LEE Suk-Jin
Department of Materials Science and Engineering, Korea University
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SUN Ho-Jung
Department of Materials Science and Engineering, Korea University
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Jung Young-hun
Department Of Materials Science And Engineering Korea University
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Lee Woo-sun
Korea Electronics Technology Institute
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Jeong Yoon-hee
Department Of Materials Science And Engineering Korea University
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Lee Suk-jin
Department Of Materials Science And Engineering Korea University
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Sun Ho-jung
Memory Research And Development Division Hynix Semiconductor Incorporation
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