Quantitative intensity measurement of equal thickness fringes in Si and MgO crystal images with an energy-filtering transmission electron microscope using an imaging plate
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 2000-10-01
著者
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SHIOJIRI Makoto
Department of Physics, Kyoto Technical University
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Shiojiri Makoto
Department Of Electronics And Information Science Kyoto Institute Of Technology
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Shiojiri Makoto
Kanazawa Medical University
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Nishio Koji
Department Of Functional Anatomy And Neuroscience Nagoya University Graduate School Of Medicine
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Nishio K
Department Of Electronics And Information Science Kyoto Institute Of Technology
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ISSHIKI Toshiyuki
Department of Electronics and Information Science, Kyoto Institute of Technology
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Isshiki Toshiyuki
Department Of Mathematical Andco Mputing Sciences Tokyo Institute Of Technology
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Shiojiri M
Kyoto Institute Of Technology
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Shiojiri M
Department Of Physics Kyoto Technical University
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Shiojiri Makoto
Department Of Electronics And Information Science Kyoto
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Nishio Koji
Department Of Electronics And Information Science Kyoto Institute Of Technology
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Nishio Koji
Department of Anatomy, Nagoya University School of Medicine
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