Drift and Hysteresis Effects on AIN/SiO_2 Gate pH Ion-Sensitive Field-Effect Transistor

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2003-08-15

著者

• CHEN Ying-Chung

  Department of Electrical Engineering, National Sun Yat-Sen University

• Cheng C‐c

  De‐lin Inst. Technol. Taipei Twn

• Chen Yih-chiin

  Department Of Botany National Chung-hsing University

• Chou J‐c

  National Yunlin Univ. Sci. And Technol. Yunlin Twn

• Chiang Jung-lung

  Department Of Electronic Engineering Chung Chou Institute Of Technology

• CHOU Jung-Chuan

  Department of Electronic Engineering, National Yunlin University of Science and Technology

• LIAU Guo

  Department of Electronic Engineering, National Yunlin University of Science and Technology

• CHENG Chien-Chuan

  Department of Electronic Engineering, De-Lin Institute of Technology

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