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Semiconductor And Integrated Circuits Division Hitachi Ltd. | 論文
- Gamma-Ray-Induced Absorption Bands in Pure-Silica-Core Fibers
- Gamma-Ray Induced Absorption Band at 770 nm in Pure Silica Core Optical Fibers
- Dynamic Terminations for Low-Power High-Speed Chip Interconnection in Portable Equipment
- Application of a Junction Field Effect Transistor Structure to a Low Loss Diode
- Application of a Junction FET Structure to a Low Loss Diode
- Dielectric Degradation Mechanism of SiO_2 Examined by First-Principles Calculations : Electronic Conduction Associated with Electron Trap Levels in SiO_2 and Stability of Oxygen Vacancies Under an Electric Field
- Dielectric Degradation Mechanism of SiO_2 Examined through First-Principles Calculations : Electric Conduction Associated with Electron Traps and Its Stability under an Electric Field
- Optimum Electrode Design for Effective Excitation of the Edge Mode by Taking Account of Its Electric Potential Distribution : SAW and Communication Device
- Gold Substrates for Scanning Tunneling Microscopy of Adsorbed Species
- Microstructures of 50-nm Cu Interconnects along the Longitudinal Direction
- Influence of Grain Size Distributions on the Resistivity of 80nm Wide Cu Interconnects
- Filling a Narrow and High Aspect-Ratio Trench with Electro-Cu Plating
- Influence of P Content in Electroless Plated Ni-P Alloy Film on Interfacial Structures and Strength between Sn-Zn Solder and Plated Au/Ni-P Alloy Film
- Influence of Phosphorus Concentration in Electroless Plated Ni-P Alloy Film on Interfacial Structures and Strength between Sn-Ag-(-Cu) Solder and Plated Ni-P Alloy Film
- Half-V_ltCCgt Plate Nonvolatile DRAMs with Ferroelectric Capacitors
- Design Guidelines and Process Quality Improvement for Treatment of Device Variations in an LSI Chip(Microelectronic Test Structures)
- Effect of Oxygen Content on Defect Formation in Pure-Silica Core Fibers
- Radiation Effects on Pure Silica Core Optical Fibers by γ-Rays : Relation between 2 eV Band and Non-Bridging Oxygen Hole Centers
- Improvement of Radiation Resistance of Pure Silica Core Fibers by Hydrogen Treatment
- Defect Termination by Nitrogen Bonding due to NO Nitridation in MOS Structures