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Seiko Instruments Inc. | 論文
- Atomic Force Microscopy in Histology and Cytology
- Evaluation of Vacuum Microcapsule Fabricated using Focused-Ion-Beam Chemical-Vapor-Deposition
- Fabrication of Diamond-Like Carbon Nanosprings by Focused-Ion-Beam Chemical Vapor Deposition and Evaluation of Their Mechanical Characteristics(Micro/Nano Fabrication,Microoptomechatronics)
- Comparison of Young's Modulus Dependency on Beam Accelerating Voltage between Electron-Beam- and Focused Ion-Beam-Induced Chemical Vapor Deposition Pillars
- Nozzle-Nanostructure Fabrication on Glass Capillary by Focused-Ion-Beam Chemical Vapor Deposition and Etching
- Three-Dimensional Nanoimprint Mold Fabrication by Focused-Ion-Beam Chemical Vapor Deposition
- DIVISION OF CULTURED ZINNIA ELEGANS CELLS IS REGULATED BY ACTIVE SPECIES OF OXYGEN
- Frequency Domain Multiplexing of TES Signals by Magnetic Field Summation( Superconducting High-frequency Devices)
- Evaluation of Field Electron Emitter Fabricated Using Focused-Ion-Beam Chemical Vapor Deposition
- Structure and Resonant Characteristics of Amorphous Carbon Pillars Grown by Focused-Ion-Beam-Induced Chemical Vapor Deposition
- Effect of RF Bias on Low-Temperature Synthesis of Aluminium Nitride Film by Hollow Cathode Discharge-Type Ion Plating
- Low-Temperature Synthesis of Aluminium Nitride Film by HCD-Type Ion Plating
- Tracking Characteristics of a Triangular-Aperture Mounted Optical Head Slider to Which a Polarized Violet Laser Source Is Applied
- P-OPT-01 TRACKING CHARACTERISTICS OF A TRIANGULAR APERTURE MOUNTED OPTICAL HEAD SLIDER APPLIED A POLARIZED VIOLET LASER SOURCE(Optical Storage/Optical Devices for Storage,Technical Program of Poster Session)
- Sub-100 nm-Resolution Grazing Incidence Soft X-Ray Microscope with a Laser-Produced Plasma Source
- Measurement of Local Density of States by Scanning Tunneling Spectroscopy at Low Temperature : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Charge Density Waves
- Effect of Atomic Force on the Surface Corrugation of 2H-NbSe_2 Observed by Scanning Tunneling Microscopy
- Observation of Atomic Image of 2H-NbSe_2 Surface by Scanning Tunneling Microscope
- Graphitized Wavy Traces of Iron Particles Observed in Amorphous Carbon Nano-pillars
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