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Seiko Instruments Inc. | 論文
- Correlation between X-Ray Reflectivity and Rutherford Backscattering Spectroscopy for Density Measurement of Thin Films
- Thermal Stability of Ni-C Multilayer Mirror for X-Rays
- Surface Roughness Evaluation of Multilayer Coated X-ray Mirrors by Scanning Tunneling Microscope
- Development of Integrated Direct Current Superconducting Quantum Interference Device Gradiometer for Nondestructive Evaluation
- Scanning Near-field Fluorescence Microscopy and Nanoscopic Fluorescence Spectroscopy in Combination with a Non-contact Scanning Force Microscope
- P-ORS-02 CONTACT FORCE DETECTION ON A MINUTE APERTURE MOUNTED OPTICAL CONTACT SLIDER USING ACOUSTIC EMISSION SENSOR
- Simulation of Simultaneous Tracking/Data Signal Detection Using Novel Aperture-Mounted Surface Recording Head
- High Spatial Resolution and Throughput Potential of an Optical Head with a Triangular Aperture for Near-Field Optical Data Storage
- Triangular Aperture as Near-Field Element for High-Density Storage(Plasmonics and Nanophotonics,Microoptomechatronics)
- Near-Field Optical Flying Head with Protruding Aperture and Its Fabrication
- Signal Readout Using Small Near-Field Optical Head with Horizontal Light Introduction Through Optical Fiber
- Numerical Simulation on Read-Out Characteristics of the Planar Aperture-Mounted Head with a Minute Scatterer
- Nano-Four-Point Probes on Microcantilever System Fabricated by Focused Ion Beam
- Large Inductance Superconducting Quantum Interference Device Magnetometer for Magnetoencephalography Measurement
- Nondestructive Magnetic Detection of Plasticized Area Using Superconducting Quantum Interference Device
- Studies on the Fine Structure of Wet Human Chromosome Fibers Unstained with No Fixative by Atomic Force Microscopy in Comparison with X-ray Contact Microscopy
- Application of Scanning Probe Microscope(SPM) for Novel Characterization of Ferrolectric Capacitor
- Application of Scanning Probe Microscope(SPM)for Novel Characterization of Ferrolectric Capacitor
- High-Sensitivity Image-Sensor-Incorporated Image Intensifier Tube with Charge-Coupled Device for X-Ray Diffraction
- X-Ray Photoelectron Spectroscopy Using a Focused-Laser-Produced Plasma X-Ray Beam