Development of Integrated Direct Current Superconducting Quantum Interference Device Gradiometer for Nondestructive Evaluation
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-04-15
著者
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ODAWARA Akikazu
SII NanoTechnology Inc.
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MOROOKA Toshimitsu
Seiko Instruments Inc.
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CHINONE Kazuo
SII Nano Technology Inc.
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Odawara Akikazu
Sii Nano Technology Inc.
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Shimizu Nobuhiro
Seiko Instruments Inc.
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Ataka Tatsuaki
Seiko Instruments Inc.
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NAKAYAMA Satoshi
Seiko Instruments Inc.
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ODAWARA Akikazu
Seiko Instruments Inc.
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CHINONE Kazuo
Seiko Instruments Inc.
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KASAI Naoko
Electrotechnical Laboratory
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Kasai N
Aist Ibaraki Jpn
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Nakayama S
Sii Nano Technology Inc.
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Morooka T
Seiko Instruments Inc.
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