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School of Science and Engineering Waseda University | 論文
- Impact of Structural Strained Layer near SiO_2/Si Interface on Activation Energy of Time-Dependent Dielectric Breakdown
- Dominant Role of Corner Holes in the Decomposition Process of Silicon Islands on Si(111) Surfaces
- Consideration on the Quantitativeness of Reflection High Energy Electron Diffraction Intensity as a Tool to Monitor the Coverage of the Si(111) Surface by 7×7 Domains
- High-Temperature Scanning Tunneling Microscopy (STM) Observation of Metastable Structures on Quenched Si (111) Surfaces
- Property and Structure of YBa_2Cu_3O_-Nb_2O_5 Composite
- Direct Observation of Self-Limiting Gallium Deposition on GaAs during Laser-Atomic Layer Epitaxial Processing
- The Multilingual text Processing(5) : Extension of POSIX to Multilingual Processing
- Sequencial Talks on The Multilingual Text Processing(1) : Multilingual Processing of Historical Scripts with the Current Scripts
- Multilingual I/O and Text Manipulation System(4) : The Optimal Data Format Converter to/from MB/WC/TMC
- Multilingual I/O and Text Manipulation System(3) : Extracting the Essential Informations from World's Writing Scripts for Designing TMC and for the Generalizing Text Manipulation
- Multilingual I/O and Text Manipulation System(2) : The Structure of the Output Method Drawing the World's Writing Scripts beyond ISO 2022
- Multilingual I/O and Text Manipulation System(1) : The Total Design of the Generalized System based on the World's Writing Scripts and Code Sets
- Almost Sure and Mean Convergence of Extended Stochastic Complexity (Special Section on Information Theory and Its Applications)
- A Generalization of B.S. Clarke and A.R. Barron's Asymptotics of Bayes Codes for FSMX Sources (Special Section on Information Theory and Its Applications)
- Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
- Structures of an Oxygen-Deficient TiO_2(110) Surface Studied by Noncontact Atomic Force Microscopy
- Influence of Near-Surface Defects in Si Induced by Reactive Ion Etching on the Electrical Properties of the Pt/n-Si Interface
- Estimation of Spatial Extent of a Defect Cluster in Si Induced by Single Ion lrradiation
- New Process for Si Nanopyramid Array(NPA)Fabrication by Ion-Beam Irradiation and Wet Etching
- Single-Event Upset Test of Static Random Access Memory Using Single-Ion Microprobe