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School of Electrical Engineering, Kookmin University | 論文
- GBSFP: General Bluetooth Scatternet Formation Protocol for Ad Hoc Networking
- A compact Verilog-A model for Multi-Level-Cell Phase-change RAMs
- Self-Aligned Dual-Gate Single-Electron Transistors (DG-SETs)
- Dual-switch power gating revisited for small sleep energy loss and fast wake-up time in sub-45-nm nodes
- GBSFP : General Bluetooth Scatternet Formation Protocol for Ad Hoc Networking
- Iterative Learning Control with Advanced Output Data Using Partially Known Impulse Response
- JPEG Quantization Table Design for Face Images and Its Application to Face Recognition(Image Media Quality)
- Low-power read circuit with self-adjusted column pulse width for diode-switch resistive RAMs
- A Modified Dickson Charge Pump Circuit with High Efficiency and High Output Voltage
- Analytic Model for the Gate Current of MODFET's with and without Photonic Control
- Analytic Model for the Gate Current of MODFET's with and without Photonic Control
- Row-by-Row Dynamic Source-Line Voltage Control (RRDSV) Scheme for Two Orders of Magnitude Leakage Current Reduction of Sub-1-V-V_SRAM's(Electronic Circuits)
- Extraction method of the interface and nitride trap density in nitride-based charge trapped flash memories using an optical response (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Extraction method of the interface and nitride trap density in nitride-based charge trapped flash memories using an optical response (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Development of Thermally-oscillating Flow and Acoustic Streaming in the Liquid by Ultrasonic Vibrations
- Fast-Delay and Low-Power Level Shifter for Low-Voltage Applications(Electronic Circuits)
- Compact and efficient Maximum Power Point Tracking circuit for portable solar battery charger
- Sunlight-variation-adaptive charge pump circuit with self-reconfiguration for small-scale solar energy harvesting
- Carry select adder with sub-block power gating for reducing active-mode leakage in sub-32-nm VLSIs