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Physics Department,Tokyo Institute of Technology | 論文
- 22aT-13 High resolution REM study on structures of high index Si surfaces induced by metal deposition
- Fabrication of Gold Nanowires Using Contact Mode Atomic Force Microscope
- Surface Structures Observed by High-Resolution UHV Electron Microscopy at Atomic Level
- Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy
- New Phase Diagram of Step Instabilities on Si(111) Vicinal Surfaces Induced by DC Annealing : Condensed Matter: Structure, etc.
- Energy-filtered Electron Interferometry in Reflection Electron Microscopy
- Direct Current Heating Induced Giant Step Bunching and Wandering on Si(111) and (001) Vicinal Surfaces
- Ultra High Vacuum Reflection Electron Microscopy Study of Step-Dislocation Interaction on Si(111) Surface
- UHV-TEM-REM Studies of Si(111) Surfaces
- A New Technique to Produce Clean and Thin Silicon Films In Situ in a UHV Electron Microscope for TEM-TED Studies of Surfaces
- Atomic Resolution TEM Images of the Au(001) Reconstructed Surface
- Epitaxy of Au and Ag on Cleaved (10, 0) Surface of MoS_2 : Surfaces, Interfaces and Films
- Electron Microscope Study on Commensurate-Incommensurate Phase Transition of Rb_2ZnCl_4 Crystals
- Direct Observation of Al_xGa_As/GaAs Superlattices by REM
- An Ion-Sputtering Gun to Clean Crystal Surfaces In-Situ in an Ultra-High-Vacuum Electron Microscope