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NTT Advanced Technology Corporation | 論文
- OPTICAL PROPERTIES OF GRAPHITE IN THE NEAR K-ABSORPTION EDGE REGION
- Electric Field Induced Reflection in GaInAsP/InP MQW Structure
- Electric Field-Induced Absorption in GaInAsP/InP MQW Structures Grown by LPE
- An Adaptive Fingerprint-Sensing Scheme for a User Authentication System with a Fingerprint Sensor LSI(Integrated Electronics)
- Thick On-Chip Interconnections by Cu-Damascene Processes Using a Photosensitive Polymer
- Selective Electrodeposition Technology for Organic Insulator Films on Microelectromechanical-System Structures
- Anti-Sticking Effect of Organic Dielectric Formed by Electrodeposition in Microelectromechanical-System Structures
- Nanometrology of Si Nanostructures Embedded in SiO_2 using Scanning Electron Microscopy
- Thick Au High-Q Inductor and Its Chip-on-Chip Bonding on an RF IC for Various Frequencies
- RF-MEMS Switch Structure for Low-Voltage Actuation and High-Density Integration
- Novel Structure and Fabrication Process for Integrated RF Microelectromechanical-System Technology
- Integrated RF-MEMS Technology with Wafer-Level Encapsulation
- Characteristics of Fingerprint Sensing on Capacitive Fingerprint Sensor LSIs with a Grounded Wall Structure
- Advanced Spin Coating Film Transfer and Hot-Pressing Process for Global Planarization with Dielectric-Material-Viscosity Control
- Evaluation of Sensitivity on a Capacitive Fingerprint Sensor LSI with a Grounded Wall Structure
- OPTICAL PROPERTIES OF FULLERENE, NANOTUBE AND CARBON COMPOUNDS IN THE NEAR K-ABSORPTION EDGE
- Low Surface Resistance of Screen-Printed YBa_2Cu_3O_ Thick Films
- Reduction of the Surface Resistance of YBa_2Cu_3O_ Pellets and Thick Films by Adding Ag
- Laser-Induced Shock Compression of Tantalum to 1.7 TPa
- Microstructure of c-Axis EuBa_2Cu_3O_y Thin Films Observed with Scanning Electron Microscopy