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Microelectronic Laboratory Semiconductor Technology Application Research(star)group Department Of El | 論文
- A Body Effect Assisted NOR-Type (BeNOR) Multilevel Flash Memory
- Comprehensive Study of a New Self-Convergent Programming Scheme for Split Gate Flash Memory
- A New Bit-Line-Controlled Self-Convergent Multilevel AND-Type Flash Memory
- Comprehensive Study of a New Self-Convergent Programming Scheme for Split Gate Flash Memory
- A New Bit-Line-Controlled Self-Convergent Multi-Level And-Type Flash Memory
- New Self-Convergent Programming Method for Multilevel AND Flash Memory
- New Self-Convergent Programming Method for Multi-Level AND Flash Memory
- Degradation of Flash Memory Using Drain-Avalanche Hot Electron (DAHE) Self-Convergence Operation Scheme
- Performance and Reliability Trade-off of Large-Tilted-Angle Implant P-Pocket on Stacked-Gate Memory Devices
- A New Ultra Low Voltage Silicon-Rich-Oxide (SRO) NAND Cell
- Self-Convergent Programming Scheme for Multilevel P-Channel Flash Memory
- High Speed F-N Operated Volatile Memory Cell with Stacked Plasma Enhanced Chemical Vapor Deposition (PECVD) Nanocrystalline Si Layer Structure
- A Novel High-Density and High-Speed NAND-Type Electrical Erasable Programmable Read Only Memory
- A Novel High-Density and High-Speed NAND-Type EEPROM
- A Unified Functional Reliability Model for N-channel Metal-Oxide-Semiconductor Field-Effect Transistors with Sub 2 nm Gate Oxide
- Optimization of Program Threshold Window from Understanding of Novel Fast Charge Loss in Nonvolatile Memory