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Joint Research Center for Atom Technology | 論文
- Observation of 1-nm-High Structures on a Si (001) Surface Using a Differential Interference Optical Microscope
- Room Temperature Nanoimprint Technology Using Hydrogen Silsequjoxane (HSQ)
- Pressure Induced Phase Transitions in Spinel and Wurtzite Phases of ZnAl_2S_4 Compound
- Anisotropic Diffusion of Si Adsorbates on a Si (001) Surface
- Direct Observation of Electron Charge of Si Atoms on a Si(001) Surface
- A Sensitive and Rapid Method for Mapping Protein Bound to DNA by Atomic Force Microscopy
- Scanning Tunneling Microscopy Study of Ultrathin Fe Films Growrn on GaAs (001) Surface
- Nitridation of Gaps (001) Surface Studied by Auger Electron Spectroscopy
- Nitridation of GaAs(001) Surface Studied by Auger Electron Spectroscopy
- Energy Shifts of Auger Transitions of Ga, As and N during Plasma-assisted Nitridation of GaAs (001) Surface
- Scanning Tunneling Microscopy Study of Hf Silicate Formed by Ulttrathin Hf Metal on SiO_2 : Effect of Hf/SiO_2 Thickness Ratio
- Evaluation of fluorinated diamond like carbon as antisticking layer by scanning probe microscopy
- Sub-10-nm-Scale Lithography Using p-chloromethyl-methoxy-calix[4]arene Resist
- Investigating Line-Edge Roughness in Calixarene Fine Patterns Using Fourier Analysis
- Mechanism of Layer-by-Layer Oxidation of Si(001)Surfaces by Two-Dimensional Oxide-Island Nucleation at SiO_2/Si Interfaces
- Mechanism of Layer-by-Layer Oxidation of Si (001) Surfaces Proceeding by Two-Dimensional Oxide-Island Nucleation at SiO_2/Si Interfaces
- Excitation-Polarization Effects on Single-Molecule Fluorescence on Quartz Surfaces
- 3F0930 Unidirectional alignment of stretched DNA molecules on an atomically flat surface
- Electrical Characterization of Atomic-Scale Defects in an Ultrathin Si Oxynitride Layer
- Atomic-Scale Structure of SiO_2/Si(001) Interface Formed by Furnace Oxidation